Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Section al specification. Part 1. Sectional specification for discrete devices.

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Bibliographic Details
Published: London : British Standards Institution, 1986
Corporate Author:
British Standards Institution (Author, Issuing body)
Series:B.S. (Series) ;
Format: Book

EPS Library, Level 1, Standards Collection

Holdings details from EPS Library, Level 1, Standards Collection
Call Number Copy Loan Type Status Request
BS QC 750000:1986, IEC 747-11:1985 AU20625448B
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