Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.
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| Edition: | 2nd completely rev. and updated ed. |
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| Published: |
Berlin ; New York :
Springer,
c1998.
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| Main Author: | |
| Series: | Springer series in optical sciences ;
v. 45 |
| Subjects: | |
| Format: | Book |
EPS Library, Level 2
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