32Si measurement using low-level scintillation spectrometry / U. Morgenstern, R.G. Ditchburn.

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Bibliographic Details
Published: Lower Hutt, N.Z. : Institute of Geological & Nuclear Sciences Ltd., 1997.
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Series:Institute of Geological & Nuclear Sciences science report ; 97/35.
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Format: Book

EPS Library, Level 1

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GB 1001.72 .R34 .M851 AU07317298B
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