Characterization methods for submicron MOSFETs / edited by Hisham Haddara.
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| Опубликовано: |
Boston :
Kluwer Academic Publishers,
c1995.
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| Другие авторы: | |
| Серии: | Kluwer international series in engineering and computer science
SECS 352. Kluwer international series in engineering and computer science. Analog circuits and signal processing |
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| Формат: | |
EPS Library, Level 3
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