The Test access port and boundary-scan architecture / [edited by] Colin M. Maunder, Rodham E. Tulloss.

Saved in:
Bibliographic Details
Published: Los Alamitos, Calif. : IEEE Computer Society Press, c1990.
Other Authors:
Maunder, Colin M.
Tulloss, Rodham E.
Series:IEEE Computer Society Press tutorial
Subjects:
Electronic circuits > Testing > Data processing.
Computer architecture.
Format: Book
The Test access port and boundary-scan architecture /
Request first available copy

EPS Library, Level 3

Holdings details from EPS Library, Level 3
Call Number Copy Loan Type Status Request
TK 7867 .T342 AU02760991B
 For loan Available now Request this copy

Similar Items