Stochastic reliability modeling, optimization and applications / editors, Syouji Nakamura, Toshio Nakagawa.

Saved in:
Bibliographic Details
Published: Singapore ; Hackensack, NJ : World Scientific, c2010.
Other Authors:
Subjects:
Format: Book

EPS Library, Level 3

Holdings details from EPS Library, Level 3
Call Number Copy Loan Type Status Request
TA 169 .S864 2010 AU15411346B
For loan Available now Request this copy