Inside the TOEIC exam / by Donald Van Metre and the staff of Kaplan Test Prep and Admissions.

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Detalhes bibliográficos
Edição:	2nd ed.
Publicado em:	New York : Kaplan Publishing, c2008.
Autor principal:	Van Metre, Donald
Autor Corporativo:	Kaplan Test Prep and Admissions
Assuntos:	Test of English for International Communication > Study guides. English language > Textbooks for foreign speakers. English language > Examinations > Study guides. English language > Business English > Examinations > Study guides.
Formato:	Livro

Central Library, Level 4

Detalhes do Exemplar Central Library, Level 4
Área/Cota Cód. Barras: Loan Type Estado Localização
PE 1128 .V262 2008 AU17102863B For loan Disponível Localização