Inside the TOEIC exam / by Donald Van Metre and the staff of Kaplan Test Prep and Admissions.

Enregistré dans:

Détails bibliographiques
Édition:	2nd ed.
Publié:	New York : Kaplan Publishing, c2008.
Auteur principal:	Van Metre, Donald
Collectivité auteur:	Kaplan Test Prep and Admissions
Sujets:	Test of English for International Communication > Study guides. English language > Textbooks for foreign speakers. English language > Examinations > Study guides. English language > Business English > Examinations > Study guides.
Format:	Livre

Central Library, Level 4

Informations d'exemplaires de Central Library, Level 4
Cote Exemplaire Loan Type Statut Réserver
PE 1128 .V262 2008 AU17102863B For loan Disponible Réserver