Inside the TOEIC exam / by Donald Van Metre and the staff of Kaplan Test Prep and Admissions.

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Detalles Bibliográficos
Edición:	2nd ed.
Publicado:	New York : Kaplan Publishing, c2008.
Autor principal:	Van Metre, Donald
Autor Corporativo:	Kaplan Test Prep and Admissions
Materias:	Test of English for International Communication > Study guides. English language > Textbooks for foreign speakers. English language > Examinations > Study guides. English language > Business English > Examinations > Study guides.
Formato:	Libro

Central Library, Level 4

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Número de Clasificación Copia Loan Type Estado Hacer reserva
PE 1128 .V262 2008 AU17102863B For loan Disponible Hacer reserva