Inside the TOEIC exam / by Donald Van Metre and the staff of Kaplan Test Prep and Admissions.

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Podrobná bibliografie
Vydání:	2nd ed.
Vydáno:	New York : Kaplan Publishing, c2008.
Hlavní autor:	Van Metre, Donald
Korporativní autor:	Kaplan Test Prep and Admissions
Témata:	Test of English for International Communication > Study guides. English language > Textbooks for foreign speakers. English language > Examinations > Study guides. English language > Business English > Examinations > Study guides.
Médium:	Kniha

Central Library, Level 4

Informace o exemplářích z: Central Library, Level 4
Signatura Jednotka Loan Type Stav Požadavek
PE 1128 .V262 2008 AU17102863B For loan Dostupné Požadavek