Inside the TOEIC exam / by Donald Van Metre and the staff of Kaplan Test Prep and Admissions.

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Dades bibliogràfiques
Edició:	2nd ed.
Publicat:	New York : Kaplan Publishing, c2008.
Autor principal:	Van Metre, Donald
Autor corporatiu:	Kaplan Test Prep and Admissions
Matèries:	Test of English for International Communication > Study guides. English language > Textbooks for foreign speakers. English language > Examinations > Study guides. English language > Business English > Examinations > Study guides.
Format:	Llibre

Central Library, Level 4

Detall dels fons de Central Library, Level 4
Signatura Còpia Loan Type Estat Fer una reserva
PE 1128 .V262 2008 AU17102863B For loan Disponible Fer una reserva