Defect-oriented testing for nano-metric CMOS VLSI circuits / by Manoj Sachdev and José Pineda de Gyvez.

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Bibliographic Details
Edition:	2nd ed.
Published:	Dordrecht : Springer, c2007.
Main Author:	Sachdev, Manoj
Other Authors:	Sachdev, Manoj. Defect oriented testing for CMOS analog and digital circuits Pineda de Gyvez, José
Series:	Frontiers in electronic testing 34
Subjects:	Metal oxide semiconductors, Complementary > Testing. Metal oxide semiconductors, Complementary > Defects. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Defects.
Format:	Book

EPS Library, Level 3

Holdings details from EPS Library, Level 3
Call Number Copy Loan Type Status Request
TK 7871.99 .M44 .S121 2007 AU14974339B For loan Available now Request this copy