Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma.

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Bibliographic Details
Published: Piscataway, N.J. : New York : IEEE Press ; Institute of Electrical and Electronics Engineers, c1997.
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Format: Book

EPS Library, Level 3

Holdings details from EPS Library, Level 3
Call Number Copy Loan Type Status Request
TK 7895 .M4 .S531 1997 AU12362506B
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