Atomic force microscope nanolithography : a thesis submitted in partial fulfilment of the requirements for the degree of Master of Engineering in Electrical and Electronic Engineering at the University of Canterbury, Christchurch, New Zealand / Edward Faang-Huei Lim.
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| Published: |
[2002]
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| Format: | Thesis Book |
| Physical Description: | xiv, 122 p. : ill. (some col.) ; 30 cm. |
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| Notes: | Typescript (photocopy). "March 2002." Thesis (M.E.)--University of Canterbury, 2002. Bib#: 816843 |
| Bibliography: | Includes bibliographical references (p. [105]-122). |
| Language: | English |
| Bib#: | 816843 |
