Optical characterization of semiconductors : proceedings of the International Conference on Optical Characterization of Semiconductors, Satellite Conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2-4, 1990 / editor, D.B. Kushev.

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Podrobná bibliografie
Vydáno:	Zurich, Switzerland ; Brookfield, VT : Trans Tech Pub., c1992.
Korporace:	International Conference on Optical Characterization of Semiconductors Sofia, Bulgaria International Conference on the Physics of Semiconductors
Další autoři:	Kushev, D. B. (Deyan B.)
Témata:	Semiconductors > Testing > Optical methods > Congresses.
Médium:	Konferenční příspěvek Kniha

EPS Library, Level 2

Informace o exemplářích z: EPS Library, Level 2
Signatura Jednotka Loan Type Stav Požadavek
QC 611.6 .O6 .I61 1990 AU08830126B For loan Dostupné Požadavek