X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand / by A. L. Rutledge.

Схожі ресурси

• Residual stress measurement by x-ray diffraction : SAE J7849 /
  Опубліковано: (1971)
• A study of residual stress patterns in rail corrugations by the x-ray diffraction technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand /
  за авторством: Crawley, A. M. (Alan Mark)
  Опубліковано: (1979)
• Mathematical theory of X-ray powder diffractometry.
  за авторством: Wilson, A. J. C. (Arthur James Cochran), 1914-
  Опубліковано: (1963)
• X-ray metallography.
  за авторством: Taylor, Abraham
  Опубліковано: (1961)
• Proceedings of the 5th conference on X-ray analytical methods.
  Опубліковано: (1966)