X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand / by A. L. Rutledge.

Na minha lista:
Detalhes bibliográficos
Publicado em: 1970.
Autor principal:
Rutledge, A. L. (Anthony Leonard)
Assuntos:
Materials > Testing
Strains and stresses.
X-rays > Industrial applications.
Formato: Thesis Livro
X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand /
Coloque um pedido de Título

Macmillan Brown Library Storage, Thesis Collection, Request for use in MB Library

Detalhes do Exemplar Macmillan Brown Library Storage, Thesis Collection, Request for use in MB Library
Área/Cota Cód. Barras: Loan Type Estado Localização
Thesis (Mechanical Engineering) copy 1 AU03408299B
 Library use only Disponível Localização

EPS Library, Level 3

Detalhes do Exemplar EPS Library, Level 3
Área/Cota Cód. Barras: Loan Type Estado Localização
TA 417.25 .R981 1970 AU05932505B
 For loan Disponível Localização

Registos relacionados