X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand / by A. L. Rutledge.

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Pubblicazione: 1970.
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Natura: Tesi Libro

Macmillan Brown Library Storage, Thesis Collection, Request for use in MB Library

Dettagli sul posseduto da Macmillan Brown Library Storage, Thesis Collection, Request for use in MB Library
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Thesis (Mechanical Engineering) copy 1 AU03408299B
Library use only Disponibile Richiedi

EPS Library, Level 3

Dettagli sul posseduto da EPS Library, Level 3
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TA 417.25 .R981 1970 AU05932505B
For loan Disponibile Richiedi