X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand / by A. L. Rutledge.

Gardado en:
Detalles Bibliográficos
Publicado: 1970.
Autor Principal:
Rutledge, A. L. (Anthony Leonard)
Subjects:
Materials > Testing
Strains and stresses.
X-rays > Industrial applications.
Formato: Thesis Libro
X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand /
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Macmillan Brown Library Storage, Thesis Collection, Request for use in MB Library

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Número de Clasificación Copia Loan Type Status Facer reserva
Thesis (Mechanical Engineering) copy 1 AU03408299B
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EPS Library, Level 3

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TA 417.25 .R981 1970 AU05932505B
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