X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand / by A. L. Rutledge.

Tallennettuna:
Bibliografiset tiedot
Julkaistu: 1970.
Päätekijä:
Rutledge, A. L. (Anthony Leonard)
Aiheet:
Materials > Testing
Strains and stresses.
X-rays > Industrial applications.
Aineistotyyppi: Opinnäyte Kirja
X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand /
Varaa teos

Macmillan Brown Library Storage, Thesis Collection, Request for use in MB Library

Saatavuus: Macmillan Brown Library Storage, Thesis Collection, Request for use in MB Library
Hyllypaikka Nide Loan Type Tila Tee varaus
Thesis (Mechanical Engineering) copy 1 AU03408299B
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EPS Library, Level 3

Saatavuus: EPS Library, Level 3
Hyllypaikka Nide Loan Type Tila Tee varaus
TA 417.25 .R981 1970 AU05932505B
 For loan Saatavissa Tee varaus

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