X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand / by A. L. Rutledge.

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Bibliographic Details
Published: 1970.
Main Author:
Rutledge, A. L. (Anthony Leonard)
Subjects:
Materials > Testing
Strains and stresses.
X-rays > Industrial applications.
Format: Thesis Book
X-ray stress measurement by the back-reflection camera technique : a thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand /

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