Skip to content
Your Account
Log Out
Login
Language
English
Te Reo Māori
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Keyword
Course code
Title
Journal Title
Author
Subject
ISBN/ISSN
Call Number
Call Number (LC)
Call Number (Dewey)
Call Number (Local)
Bib#
Barcode
Series
Browse Alphabetically: By Title
Browse Alphabetically: By Author
Browse Alphabetically: By Topic
Browse Alphabetically: By LC Call Number
Browse Alphabetically: By Dewey Call Number
Find
Advanced
UC Library
Library Catalogue
X-ray stress measurement by th...
Text this
Text this:
X-ray stress measurement by the back-reflection camera technique :
Number:
Loading...
