Rutledge, A. L. (1970). X-ray stress measurement by the back-reflection camera technique: A thesis presented for the degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand.
Citação do estilo Chicago (17ª ed.)Rutledge, A. L. X-ray Stress Measurement by the Back-reflection Camera Technique: A Thesis Presented for the Degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand. 1970.
Citação MLA (9ª ed.)Rutledge, A. L. X-ray Stress Measurement by the Back-reflection Camera Technique: A Thesis Presented for the Degree of Master of Engineering in Mechanical Engineering in the University of Canterbury, Christchurch, New Zealand. 1970.
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