Advanced microscopy techniques III : 15-16 May 2013, Munich, Germany / Emmanuel Beaurepaire, Peter T. C. So, editors ; sponsored by the Optical Society (United States), SPIE ; with support from Air Force Office of Scientific Research (United States), ThorLabs (United Kingdom) ; student award sponsors Toptica Photonics AG (Germany), Zeiss (United States).

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Published: Bellingham, Washington : SPIE, [2013]
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Series:Progress in biomedical optics and imaging ; v. 14, no. 47.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 8797.
Format: Conference Proceeding eBook