Advanced microscopy techniques III : 15-16 May 2013, Munich, Germany / Emmanuel Beaurepaire, Peter T. C. So, editors ; sponsored by the Optical Society (United States), SPIE ; with support from Air Force Office of Scientific Research (United States), ThorLabs (United Kingdom) ; student award sponsors Toptica Photonics AG (Germany), Zeiss (United States).
Saved in:
| Published: |
Bellingham, Washington :
SPIE,
[2013]
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| Online Access: | |
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| Series: | Progress in biomedical optics and imaging ;
v. 14, no. 47. Proceedings of SPIE--the International Society for Optical Engineering ; v. 8797. |
| Format: | Conference Proceeding eBook |
