MARC

LEADER 00000cam a2200000 a 4500
001 238143
005 20081125084200.0
008 890413s1987 maua b 001 0 eng
010 |a  87017302  
020 |a 0898382440 
035 |a 238143 
035 |a (upgd41) 87017302 
035 |a (nzNZBN)3926004 
035 |a (OCoLC)16224692 
040 |d FMlbTMQ 
050 0 0 |a TK7874  |b .W34 1987 
082 0 0 |a 621.38173 
090 |a TK 7874 .W178 
097 |3 Bib#:  |a 238143 
100 1 |a Walker, Duncan Moore Henry. 
245 1 0 |a Yield simulation for integrated circuits /  |c by Duncan Moore Henry Walker. 
260 |a Boston :  |b Kluwer Academic Publishers,  |c c1987. 
300 |a x, 209 p. :  |b ill ;  |c 25 cm. 
440 0 |a Kluwer international series in engineering and computer science.  |p VLSI, computer architecture, and digital signal processing. 
500 |a Based on author's thesis (Ph. D.) 
500 |a Includes index. 
504 |a Bibliography: p. [189]-206. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Design and construction  |x Mathematical models. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Design and construction  |x Data processing. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Defects  |x Mathematical models. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Defects  |x Data processing. 
650 0 |a Monte Carlo method. 
991 |a 1995-08-30 
992 |a Created by , 30/08/1995. Updated by osmo, 25/11/2008. 
999 f f |i 2c07d79a-adcb-53b8-b66e-46a0c4549da8  |s 263b77e7-57d3-54d8-b9f5-be4130210a40  |t 0 
952 f f |p For loan  |a University Of Canterbury  |b UC Libraries  |c EPS Library  |d EPS Library, Level 3  |t 0  |e TK 7874 .W178  |h Library of Congress classification  |i Book  |m AU00315737B