Yield simulation for integrated circuits / by Duncan Moore Henry Walker.

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Bibliographic Details
Published:	Boston : Kluwer Academic Publishers, c1987.
Main Author:	Walker, Duncan Moore Henry
Series:	Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Mathematical models. Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Defects > Mathematical models. Integrated circuits > Very large scale integration > Defects > Data processing. Monte Carlo method.
Format:	Book

EPS Library, Level 3

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TK 7874 .W178 AU00315737B For loan Available now Request this copy